Ambios XP-2 Stylus Profilometer
Ambios XP-2 Stylus Profilometer
Ambios XP-2 Stylus Profilometer
The Ambios Technology, Inc. XP Stylus Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure precision step heights from under 10 angstroms to as large as 100 microns ( 400µm with the extended sensor option), the XP profiler provides more than five orders of magnitude of precision Z height measurement. The profiler incorporates a new optical deflection height measurement mechanism and magneto static force control system which results in a low force (loads as small as .05 mg) and low inertia stylus assembly, making it the most innovative bench top profiler on the market today. These innovations combine to produce a surface profiler capable of measuring soft films and substrates without surface damage.
Specs & Options:
- Measurement of vertical features ranges from under 10Å to approximately 400µm with a vertical resolution of 1Å at 10um setting and 15Å at 100um setting.
- Measurements can be taken in metric or English units, which are selectable independently for horizontal and vertical parameters.
- Up to 60,000 data points per profile guarantees that the horizontal resolution is generally limited by the stylus radius and not the number of data points.
- Measurement of many roughness and waviness parameters with the roughness and waviness separated by user-selectable cutoff filters.
- Motorized positioning of the sample surface to within a few microns in X-Y using the XP-2 configuration.
- Many easy to use features, including adjustable force control, intuitive user interface, easy mouse control of measurement cursors and stage position.
- Accommodates samples up to 200mm in diameter and less than 30mm thick.
- 3-D and advanced analysis package extends the measurement capabilities of the XP-2 platform without new hardware requirements.
Location: Rowan Glassboro Campus, Science Hall, Room 113
Questions about this equipment can be directed to Dr. Ted Scabarozi at scabarozi@rowan.edu
Scheduling & Training
This equipment is available for use by Rowan students, faculty, and staff, as well as external partners. Requests to use this equipment can be made through BookMyLab. To sign up for a BookMyLab account, visit rowanphysics.bookmylab.com and follow these instructions.
The use of this equipment requires training. Typically one single training session is required (flat fee). Please contact Dr. Ted Scabarozi at scabarozi@rowan.edu to schedule a training session.
Pricing
|
Internal/External Academic |
SBIR/STTR |
Corporate Collaborator/ Government |
Corporate |
|
|
Per Sample Rate |
Free |
$5.00 |
$7.50 |
$15.00 |
|
Training & Technical Assistance |
$5.00 |
$7.50 |
$15.00 |
$30.00 |
|
Sample Service |
$5.00 |
$10.00 |
$10.00 |
$15.00 |
|
Technical Service |
$10.00 |
$20.00 |
$20.00 |
$30.00 |
Department of Physics & Astronomy: Equipment Index
The Department of Physics & Astronomy has microscopes, spectrometers, physical property characterization tools, synthesis tools, and general purpose equipment, available for use by Rowan students, faculty, and staff, as well as external partners.