Bruker Dimension Icon XR Scanning Probe Microscope
Bruker Dimension Icon XR Scanning Probe Microscope
Bruker Dimension Icon XR Scanning Probe Microscope
This microscope has attachments for atomic force and magnetic force measurements. Peak-force tapping mode can be used for nanometer resolution of mechanical properties. In addition, the system can also do scanning electrochemical microscopy.
- AFM Contact Mode & Tapping Mode
- Conductive Atomic Force Microscopy (C-AFM)
- PeakForce Tunneling AFM (PFTUNA)
- PeakForce Quantitative Nanomechanics (PFQNM)
- PeakForce Scanning Electrochemical Microscopy (PFSECM)
- AFM nano-Dynamic Mechanical Analysis (AFM-nDMA)
Location: Rowan Glassboro Campus, Science Hall, Room 109
Questions about this equipment can be directed to Dr. Ted Scabarozi at scabarozi@rowan.edu
Scheduling & Training
This equipment is available for use by Rowan students, faculty, and staff, as well as external partners. Requests to use this equipment can be made through BookMyLab. To sign up for a BookMyLab account, visit rowanphysics.bookmylab.com and follow these instructions.
The use of this equipment requires training, Typically 4-6 hours (multiple sessions) depending on options
Imaging tips are not included; they must be purchased beforehand.
Please contact Dr. Ted Scabarozi at scabarozi@rowan.edu to schedule a training session.
Pricing
|
Internal/External Academic |
SBIR/STTR |
Corporate Collaborator/ Government |
Corporate |
|
|
Hourly Usage Rate |
$20.00 |
$40.00 |
$60.00 |
$120.00 |
|
Training & Technical Assistance |
$50.00 |
$75.00 |
$75.00 |
$100.00 |
|
Sample Service |
$75.00 |
$100.00 |
$100.00 |
$150.00 |
|
Technical Service |
$150.00 |
$200.00 |
$200.00 |
$250.00 |
Department of Physics & Astronomy: Equipment Index
The Department of Physics & Astronomy has microscopes, spectrometers, physical property characterization tools, synthesis tools, and general purpose equipment, available for use by Rowan students, faculty, and staff, as well as external partners.
