Rigaku Primus II Wavelength Dispersive X-ray Fluorescence Spectrometer

Rigaku Primus II Wavelength Dispersive X-ray Fluorescence Spectrometer

Rigaku Primus II Wavelength Dispersive X-ray Fluorescence Spectrometer

Nondestructive measurements can be made for chemical composition for elements as light as boron.  This instrument can analyze thin film, powder, bulk and liquid materials in vacuum or helium atmosphere.

  • 4kW Rh X-ray Source (End Window)
  • Environments: Vacuum and Helium (Liquids)
  • 6 Crystals for Measuring Beryllium (Be) to Uranium (U)
  • EZ-Scan Mode for Quick Sample Analysis
  • QUAL & QUANT Modes for More In Depth Analysis
  • Automated 48 Sample Changer
  • Sample Spinning and Mapping Capabilities
  • Analysis Spot Sizes From 1-30mm
  • Die Press Available for 10mm and 30mm Pellet Forming

Location: Rowan Glassboro Campus, Science Hall, Room 108

Questions about this equipment can be directed to Dr. Ted Scabarozi at scabarozi@rowan.edu